Struct AdjustedMetrics 

pub struct AdjustedMetrics {
    pub has_overlaps: bool,
    pub lsb: Option<f32>,
    pub advance_width: Option<f32>,
}

Information and adjusted metrics generated while drawing an outline glyph.

When applying hints to a TrueType glyph, the outline may be adjusted in the horizontal direction, affecting the left side bearing and advance width of the glyph. This captures those metrics.

Fields

has_overlaps: bool

True if the underlying glyph contains flags indicating the presence of overlapping contours or components.

lsb: Option<f32>

If present, an adjusted left side bearing value generated by the scaler.

This is equivalent to the horiBearingX value in FT_Glyph_Metrics.

advance_width: Option<f32>

If present, an adjusted advance width value generated by the scaler.

Note that, like FreeType, this value is always rounded when hinting is requested even if the font does not contain any hinting instructions. This might be relevant for CFF where the hinter never adjusts outlines in the horizontal direction, in which case, using the linear advance width from GlyphMetrics may be desirable.

This is equivalent to the advance.x value in FT_GlyphSlotRec.

Trait Implementations

impl Clone for AdjustedMetrics

fn clone(&self) -> AdjustedMetrics

Returns a duplicate of the value.

fn clone_from(&mut self, source: &Self)

Performs copy-assignment from source.

impl Debug for AdjustedMetrics

fn fmt(&self, f: &mut Formatter<'_>) -> Result

Formats the value using the given formatter.

impl Default for AdjustedMetrics

fn default() -> AdjustedMetrics

Returns the “default value” for a type.

impl Copy for AdjustedMetrics